Nondestructive Characterization of Advanced Polymeric Materials - Bruker Webinar - The International NanoScience Community

Atomic Force Microscopy (AFM) is a powerful technique for mapping topography with resolution down to the atomic level. PeakForce Tapping expands upon traditional AFM by making it radically easier to use while retaining high quality topographic imaging. With PeakForce QNM, PeakForce TUNA and PeakForce KPFM, PeakForce Tapping also enables quantitative nanoscale maps of mechanical and electrical sample properties, at similar resolution to the topographic maps. These capabilities have made PeakFoce Tapping the fastest growing new AFM mode producing hundreds of new publications last year alone. In this webinar we will review a selection of publications highlighting new information obtained by PeakForce Tapping on polymer materials in fields ranging from batteries to organic photovoltaics.

This joint webinar will focus on polymer materials characterization using the highly complementary techniques of Atomic Force Microscopy (AFM) and vibrational (infrared and Raman) spectroscopy.

The webinar will have a Q&A session - bring your questions and join us for this informative event!

Nondestructive Characterization of Advanced Polymeric Materials - Bruker Webinar

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