Atomic Force Microscopy Seminars on Line!
Agilent Technologies invites you to attend our scientific e-Seminars. These exclusive one-hour live events provide a great opportunity to learn about some of the latest atomic force microscopy (AFM) techniques and applications. There will also be Q&A sessions in which all online attendees can query the presenters directly.
Register now for one or more of these informative events!
"AFM Troubleshooting Basics"
Date: March 15 @ 10:00 a.m. (ET)
Topic: How to Troubleshoot an Atomic Force Microscope
Song Xu, Ph.D. (Agilent Technologies)
Most AFM-related problems do not involve hardware defects and can be diagnosed without an engineering background. We will discuss several topics here, including: tip-related problems, parameter-related problems, sample-mounting-related problems, connection problems, noise-related problems, and drift sources and solutions. Feel free to e-mail us additional AFM troubleshooting topics you would like to see addressed, or your own AFM troubleshooting solutions.
"New Cantilevers for Basic & Advanced AFM"
Date: March 30 @ 10:00 a.m. (ET)
Topic 1: Back to the Basics: How to Choose the Right Cantilever
Song Xu, Ph.D. (Agilent Technologies)
We will discuss one of the key fundamental aspects of obtaining a good-resolution AFM image of a sample, that is, how to choose the right cantilever for your application. There are more than 10 cantilever manufacturing companies around the world, each of which produces cantilevers made of different materials, with different coatings, stiffnesses, resonance frequencies, and qualities. We will discuss how to understand the parameters of a cantilever, which cantilever to choose, how to judge the quality of the tip, and how to take advantage of uniquely designed cantilevers.
Topic 2: Advanced AFM Probes, Probes for Special Applications & New Tip Developments
Oliver Krause, Ph.D. (NanoWorld Group)
Besides "everyday use" AFM probes, there is a large variety of brand new tips and cantilevers now available for special applications. Many of these advanced AFM probes will be presented in this seminar. An overview of tips and cantilevers for exceptional or novel AFM applications (such as nanoindentation probes, cantilevers for imaging at higher harmonics, and tips for high-speed AFM) will be given.
"A Double Feature for Film Buffs"
Date: April 7 @ 10:00 a.m. (ET)
Topic 1: High-Resolution Characterization of Organic Ultrathin Films Using AFM
Jing-jiang Yu, Ph.D. (Agilent Technologies)
High-resolution characterization of organic ultrathin films and related materials using AFM provides a better understanding of interfacial structures and local properties. Various types of samples - including self-assembled monolayers (SAMs), polymers, and few-layer graphene (FLG) - are investigated with the Agilent 5600LS AFM system. Recent AFM examination results of high-throughput fabrication of SAM nanostructures via nonconventional lithography methods will also be shown.
Topic 2: Atomic Force Acoustic Microscopy - One Tool, Multiple Applications
Malgorzata Kopycinska-Mueller, Ph.D. (IZFP-Dresden)
Atomic force acoustic microscopy (AFAM) employs resonance frequencies of an AFM cantilever contacting a sample surface to determine elastic properties. This highly sensitive, versatile tool works in imaging or spectroscopy mode, providing information on the elastic properties of a sample with nanoscale spatial resolution. It can be used to detect SAMs, ferroelectric domains, subsurface defects, and changes in film-substrate adhesion, as well as to determine the elastic properties of films with thicknesses in the nm range. Recent data acquired using an Agilent 5600LS AFM system will be presented.
Join us for one or more of these exciting live events!
Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.
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