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New e-Seminars this March & April: Achieve Better Results with AFM!
Agilent Technologies' immensely popular educational series detailing how to use atomic force microscopy for better results is back! Join us online for a pair of new scientific e-Seminars this March and April.
Learn new strategies, get quick pointers, and much, much more! It's the kind of helpful information you won't find anywhere else. These exclusive one-hour live events will be led by Agilent senior application scientist Dr. Song Xu. All online attendees can query the presenter directly during open Q&A sessions.
Register now for one or both of these exciting and engaging seminars!
Date: March 13 @ 10:00 a.m. ET
Presenter: Song Xu, Ph.D. (Agilent Technologies)
Title: AFM Techniques - Analyze Your Sample and Research Project To Choose the
Right Tip and Parameters for the Best Resolution
While our past seminars have covered key AFM operation topics such as choosing modes, imaging media, cantilevers, and parameters, as well as helpful tips for sample preparation, we will now discuss how to apply this knowledge in order to obtain the best-resolution image of a sample.
Here, our focus will shift to samples and research topics. We will discuss various approaches in light of comprehensive strategies that involve analyzing both the sample itself and the research project intentions using existing skills and techniques. Since each type of sample may work under more than one type of approach in terms of sample preparation and imaging parameter selection, we will present and discuss the different result information that can be obtained under different approaches. Actual case studies and data measurement will be shown.
Date: April 10 @ 10:00 a.m. ET
Presenter: Song Xu, Ph.D. (Agilent Technologies)
Title: Agilent's Premier AFM Technology - Introducing the New 7500 Research AFM
In this seminar, we will introduce Agilent's premier atomic force microscope for research, the new 7500. This flagship AFM platform utilizes a truly unique design concept and advanced scanning technology to offer endless application potential. We will discuss the following 7500-related topics:
- Concepts of flexure scanning and miniaturization
- Physics of integration and modularity
- Latest five-axis machining fabrication (for instrument rigidity and reduced noise)
- Uniqueness and benefit of an integrated total scan
- The virtually limitless possibilities for expanding instrumentation and research
We will use schematics, application modification examples, and actual data to showcase the 7500.
Join us for one or both of these highly informative live events!
Register
Agilent e-Seminars feature a user-friendly, web-based conferencing system that allows you and your colleagues to take part in real-time, interactive presentations on subjects that are pertinent to your work.
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