Bruker Nano Surfaces Division
Free Online Web Seminar
Comparative and Correlative imaging of Polymers
and biological samples by SEM, TEM and AFM
This webinar will take place on:
Wednesday, 21 November 2012
16:00 UK | 17:00 European | 11:00 US Eastern | 08:00 US Pacific
A quarter century after it’s invention, the Atomic Force Microscope (AFM) is joining the older Electron Beam base microscopy techniques as an increasingly mature and productive characterization tool with nanometer spatial resolution.
While in a few applications, like the characterization of polymer blend morphology, the AFM has replaced the TEM in many labs (while taking full advantage of existing TEM sample prep experience), in many more instances, the complimentary strengths of AFM, like mechanical property contrast of soft materials, quantitative 3D topography and roughness, and broad compatibility with different sample environments make it an attractive element of multi-technique and correlative characterization approaches, which lead to a more complete understanding of a sample.
We will discuss comparative cases where different techniques provide the answer, and compare the efforts involved with each approach. We will also discuss cases where each technique contributes a different piece of information about the same sample, and where the combination of information leads to a more complete characterization.
Dr Johannes Kindt
Johannes Kindt received his undergraduate degree in Physics from the Technical University Kaiserslautern, Germany. For his Graduate work, he joined Paul Hansma's Lab at UC Santa Barbara on a Fulbright scholarship, and received his PhD for his new designs for High Speed AFM scanners, and his research on the ultrastructure and nanoscale failure behavior of bone and other biocomposites. He joined the Bruker AFM development team in 2005, and has led development efforts on a number of projects, including High Speed AFM technology, and AFM integration with high performance optical microscopy and with cell biological methods. His current focus is on the development of High Speed AFM applications, cross-technique high resolution microscopy, and the adoption of the AFM into new areas of research. Johannes is an author of over 25 peer-reviewed publications, and holds several patents. He currently lives near Karlsruhe, Germany.