Become familiar with the latest characterisation methods at the University of Oxford’s Begbroke Science Park and at the Department of Materials.

Over the two days (30 June - 1 July 2018), the presentations, discussions and demonstrations focus on characterisation and problem-solving in surface and interface science and technology as well as characterisation of nanoparticles and nanostructures. In particular, the following groups of techniques are considered:

• Surface specific electron spectroscopic (XPS) and spectrometric (SIMS) techniques;
• Electron-optical analytical and imaging (EPMA/WDS, SEM/EDS, TEM/EDS, HRTEM) techniques;
• Photon spectroscopic (IR and Raman probes) and thin-film profilometry techniques;
• Scanning probe (AFM in various operational modes) and stylus (Dektak) techniques;
• Light scattering for particle characterisation (particle analysis, dynamic light scattering, centrifugal sedimentation, laser diffraction).

Contact nano@conted.ox.ac.uk for more details