Micro and Nano Characterizations Facility and Nantional Nano Fabrication Centre at Centre for Nano Science and Engineering, IISc Bangalore

http://http://www.nano.iisc.ernet.in/mncf/mncf_info.htm

Details / Technical Specifications of Instruments available at CeNSE, IISc Bangalore:

Sl. No.

Instrument

 Details

1

SEM - EDS

  • Ultra High Resolution Carl Zeiss Field Emission SEM with EDS and Cathodoluminescence attachments
  • Operating range 0.02 – 30 kV
  • Sub nanometer resolution at 15kV
  • Composition information through EsB detector
  • Low kV BSE imaging at short working distances

2

AFM

  • Bruker AFM for atomic scale characterization
  • Contact mode, Tapping mode, Magnetic force microscopy and electric force microscopy
  • Scanning Tunnelling Microscopy STM mode
  •  Capability to measure piezo response, Force modulation etc.

 

3

Raman Spectroscopy

  • High spectral resolution of 0.3 cm-1
  • 1 micron spatial resolution
  • 325 and 524 nm exciting lasers for Raman / MicroPL
  • Wide range of PL spectra – UV-Vis-NIR

4

Ellipsometry

  • High Precession

5

Profilometry

  • Non contact optical profilometer for surface characterization
  • 2.2 mm vertical range, 0.01 nm Z resolution
  • 0.4 nm lateral resolution
  • 1048 X 1048 pixel array for high resolution

6

DC Probe Station

  • I-V, pulse I-V and impedance measurements
  • Impedance measurement range from 10 mW to 200 MW
  • Impedance measurements over wide frequency range – 40Hz to 110MHz
  • Quasi-static and medium range C-V measurements possible
  • High resolution measurements down to 0.1 fA and 0.5 mV

 

Please make a note that there is no waiting time for equipment usage.

We have other characterizations facility also. We have provision to give discount for fabrication and characterization to academic institutes researchers of India.

For more details please contact:

Dr. Sanjeev Srivastava

Coordinator, CeNSE,

IISc Bangalore

Ph: 080-23603281 (M-08277566371)

Views: 351

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Comment by SANJEEV KUMAR SHRIVASTAVA on December 22, 2012 at 8:09am

If you have any question contact me at inup@cense.iisc.ernet.in.

External academic user can avail this facilty at 50% discount. For detail mail us.


Full member
Comment by Victor S. Abrukov on December 12, 2012 at 1:45pm

A large amount of experimental data on the characteristics of nanomaterials can be obtained by use of these techniques. But these data should be generalized, represented in the form of a knowledge base.

 

Knowledge Base is the tool of generalization of experimental data, the tool of uncovering hidden patterns; the tool for creation of multifactor computational models. These computational models are able to predict the properties and characteristics of nanomaterials of the uninvestigated compositions or for previously unstudied modes of technological processes.

The purpose of our project is to create a knowledge base by means of Data Mining.

The project will use a Russian side analytical platform that contains all tools of Data Mining. It are able to meet the challenges of the project at the advanced level.

Examples of our studies deal with the project are presented in our report: http://www.nanopaprika.eu/group/nanoindiadays/page/nid2012-201

 

So, Dear Dr. Sanjeev Srivastava, we suggest to add our possibilities for your  Micro and Nano Characterizations Facility.


Full member
Comment by Lori Rastogi on December 12, 2012 at 1:24pm

Thank you very much for the information. But what is the procedure for getting the analysis done for outside candidates and also the tariff.


Full member
Comment by Gopinath Packirisamy on December 12, 2012 at 6:27am

Great job...Thanks a lot for the information

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