"Spicy world of NanoScience" since 2007
To review the background of different imaging modes with a special focus on the analysis of surface properties with dynamic force spectroscopy, here is the course :
Surface Analysis with AFM
|December 15, 2011||in Neuchâtel|
|Registration deadline:||Monday, December 5 (before 12:00)|
To see the course description and to register, please click on the link above.