Bruker Metrology Webinar Series
Empowering Today's Nanoscale Research with PeakForce Tapping
Wednesday, January 29, 2014
8AM PT / 3PM GMT Register Here
Atomic Force Microscopy (AFM) is a powerful technique for mapping topography with resolution down to the atomic level. Bruker's proprietary PeakForce Tapping® expands upon traditional atomic force mircoscopy by making it easier to use for infrequent users, and ScanAsyst®, which is based on this technology, automatically optimizes all key parameters other than magnification (scan size) to minimize tip sample forces while retaining high-quality topographic imaging. PeakForce Tapping also makes possible nanoscale maps of other sample properties in addition to topography. Modes such as PeakForce QNM®, PeakForce TUNA™ and PeakForce KPFM™ use PeakForce Tapping to provide mechanical and electrical property maps simultaneously with similar nanoscale resolution to the topographic maps.
Since its release in 2010, PeakForce Tapping has become the principle atomic force microscope (AFM) mode with the fastest growing publications record. In this webinar we will take a look at the growth of PeakForce Tapping in AFM research. Additionally we will review some of the key publications in a wide range of fields that have made use of PeakForce Tapping.
Topics that will be covered:
» Material property mapping at the nanoscale in materials research
» High-resolution imaging
» Bimolecular and cell biology
» Battery applications
» Graphene applications
» Organic, photovoltaic, etc.
Attendees will also receive a link to a downloadable citation list of key publications that can be imported into popular bibliography management software packages.
Register for the live event!
8AM PST Registration
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