Atomic Force Microscopy Webinar: Simultaneous Electrical and Mechanical Property Mapping at the Nanoscale with PeakForce TUNA
Overview
This webinar discusses the basics of PeakForce TUNA, compares it to standard Contact Mode based TUNA, and provides data demonstrating the unique capabilities and the differentiated applications enabled through the combination of PeakForce Tapping, and AFM conductivity measurements, on samples such as organic solar cells, lithium ion battery, and nano-materials.
Read the full webinar details on the Nanoscale World Community Events Page and be sure to join the community AFM Webinar Group to get all the latest updates first.
This broadcast will include a fully-interactive Q&A session to answer all your questions and share your ideas, so be sure to register early to reserve your seat.
There will also be a second live broadcast in Chinese.
Topics
• Enable reliable nano-electrical imaging on soft delicate samples such as loosely bound nanostructures, conductive polymers
• Enhance material assignments on the nanoscale by making use of both quantitative nano-mechanical and nano-electrical properties
• Preserve sample and measurement integrity with integrated ppm environmental control in battery and organic electronic (solar, LED) applications
• Improve imaging resolution and tip lifetime while making conductive AFM measurements easier
Registration
Live Broadcast in English
Wednesday, February 23, 2011 8:30 AM - 9:30 AM PST
Live Broadcast in Chinese
Wednesday, February 23, 2011 5:00 PM - 6:00 PM PST
Bruker Nanoscale World Community
Bruker AFM Webinars
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We look forward to seeing you online.
Sincerely,
Your Nano Surfaces AFM Webinar Team
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