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Atomic Force Microscopy Webinar Series
The Dimension FastScan AFM: SEM-like User Experience
True 3D Nanometrology and Quantitative Material Property Mapping in Ambient, Fluid, and Controlled Environments
Hosted by Microscopy and Analysis
Webinar Date & Time
Wednesday, December 7, 2011
This webinar will focus on the use of the Dimension FastScan atomic force microscope to obtain true 3D nanometrology and quantitative material property mapping in ambient, fluid, and controlled environments to give an SEM-like user experience.
Don't miss this unique opportunity to hear about the latest research using the world's fastest AFM.
The live broadcast will include a fully-interactive Q&A session to answer all of your applications questions. Register today to reserve your seat.
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