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Atomic Force Microscopy Webinar Series AFM in the World of LEDs Webinar Date & Time Wednesday, April 24, 2013  |
Presenters Dr. Stefan Kaemmer, Senior Applications Scientist, Bruker Nano Surfaces |
Webinar Overview With the demise of incandescent lighting, semiconductor and organic light-emitting diodes (LED, OLED) are becoming a key component of today’s modern technology; this includes: automotive indicator lights, displays in smart phones, televisions, and increasingly, general lighting. The layered structure of LEDs, with many nanometer sized key components, presents a unique challenge during the development and production process. Atomic Force Microscopes (AFM) are unique with their ability to address these problems by using their sub-nanometer resolution capabilities for topographic measurements, in addition to, their capability to perform electrical and mechanical measurements - using techniques such as PeakForce Tapping and scanning Kelvin Probe Microscopy (KPFM). This webinar will provide researchers, product developers, and engineers in failure analysis and QA/QC in the LED and OLED industries with an introduction to AFM applications on patterned sapphire substrates for nitride LEDs as well as applications in the field of OLEDs. The live broadcast will include a fully-interactive Q&A session to answer all of your applications questions. Register today to reserve your seat. REGISTER ONLINE Wednesday, April 24, 2013 The Atomic Force Microscopy Webinar Series and Archives An open and free resource for atomic force microscope owners and users Watch Our AFM Videos On YouTube Bruker Nano Surfaces YouTube Channel Sincerely, Your AFM Webinar Series Team |
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