Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 10:21am — No Comments
TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It’s a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and scanning tunnelling microscopy.
HOPG crystals are widely used as substrates in STM (Scanning Tunneling Microscopy). The most distinguishing…
Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 9:53am — No Comments
TipsNano Co is an International Company created on the basis of the fundamental experience in SPM field. All our team has worked in AFM research sphere during 20 years and accepted high level of professionalism.
Starting to supply with accessories for scanning probe microscopy, TipsNano is getting a high-tech company and widened our manufacture and sales boundaries in the…Continue
Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 9:43am — No Comments
Easy to use
Lower price as compared to most existing AFM systems – starting from 31 000€
Self-installed (easy to install, detailed user guides allow to assemble and run the system without manufacturer’s specialists)
Possibility to achieve atomic resolution once the system installed
Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 9:38am — No Comments
decoupled X,Y,Z flexure stage with high accuracy optical sensor
open design of measuring head
Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 9:30am — No Comments
Sharp Conductive Single Crystal Diamond Probes
Highly conductive Apex Sharp diamond probes, formed by a unique patented process ensure the best possible nanomechanical and electrical performance. These tips are sharper and last longer than any other electrical AFM probe. The conductive diamond coating is highly doped with boron which leads to a macroscopic resistivity of 0.003 – 0.005 Ohm∙cm. Contact resistance is typically 10 kΩ…Continue
Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 9:18am — No Comments
The results of an experimental study of the modification of probes for critical-dimension atomicforce
microscopy (CD-AFM) by the deposition of carbon nanotubes (CNTs) to improve the accuracy with
which the surface roughness of vertical walls is determined in submicrometer structures are presented. Methods
of the deposition of an individual CNT onto the tip of an AFM probe via mechanical and electrostatic
Added by AFM Probes, Tips, and Cantilever on July 2, 2017 at 9:04am — No Comments
The method of Atomic Force Microscopy (AFM) holds the greatest
promise for surface diagnostics and analysis. The use of AFM allows
one to study the local geometric, electrical, and mechanical properties
of the substrate surface and form nanoscale structures on the surface
of solids . The resolution of AFM is defined by many factors, most of
which are related to the shape and quality of the preparation of probes.
Added by AFM Probes, Tips, and Cantilever on June 30, 2017 at 4:44am — No Comments
Join thousands of users that have purchased TipsNano AFM Probes for their projects. We offer the best and most reliable probes that are modestly priced and well proven in hundreds of scientific and top tier publications over the last 15 years. The Probe and Surface Laboratory at TipsNano boasts a large catalog of Modified and/or Functionalized AFM probes to meet your application needs.
Added by AFM Probes, Tips, and Cantilever on June 13, 2017 at 12:33pm — No Comments
Start saving with TipsNano’s newest line of high-quality, low cost probes. Whether you’re an academic research institution looking for the most affordable probe available, or a high-volume industrial facility looking for dependability at a great price, our inexpensive probes provide precision and durability at the best value on the market.
The company TipsNano represents all types…Continue
Added by AFM Probes, Tips, and Cantilever on June 13, 2017 at 12:00pm — No Comments