"Spicy world of NanoScience"
LensAFM Webinar:
Advancements in Instrumentation for
Surface Inspection and Defect Analysis
Webinar Date: 09 May 2012…
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T-MDT is happy to invite you to the webinar “Tip Enhanced Raman Scattering. Approaching 10 nm spatial resolution in Raman imaging” by Dr. Pavel Dorozhkin.
Tip Enhanced Raman Scattering (TERS) is the technique utilizing a special AFM probe (nano-antenna) to localize light at the nanometer scale area near the probe apex. When scanning the sample with respect to the probe, the obtained optical (Raman or fluorescence) maps have lateral resolution which is not limited by the light…
Added by TINC on March 2, 2012 at 11:04am — No Comments
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Atomic Force Microscopy Webinar Series… |
Added by TINC on February 29, 2012 at 7:13pm — No Comments
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Miniaturization of…
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Atomic Force Microscopy Webinar Series… |
Added by TINC on January 6, 2012 at 8:08pm — No Comments
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is being held on
Wednesday 11 January 2012
at 4pm (UK), 5pm (CET) and 11am (EDT)…
Added by TINC on January 5, 2012 at 7:16pm — No Comments
We are launching a series of online short courses on nanoscience and nanotechnology that will be offered over the next couple of years. This initiative builds on the open content we have on nanoHUB.org. We think the approach is unique - the courses are designed to be broadly accessible without many prerequisites, and the material is presented in an original way. Students get access to a completely new set of lectures not available on nanoHUB, extensive lecture notes, exams, homeworks, Q…
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SEM like user experience, True 3D nanometrology
and quantitative material property mapping in ambient, fluid, and controlled environments
is being held on
Wednesday, 07 December 2011…
Added by TINC on November 24, 2011 at 7:04pm — No Comments
Atomic Force Microscopy Webinar Series
In Situ Monitoring of Lithium Battery
Electrode Processes Using Integrated Atomic Force…
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Free Educational Webinar about Sample Preparation
for Scanning Electron Microscopy:
State of the Art Critical Point Drying with the new
fully automated Leica EM CPD300
Added by TINC on October 13, 2011 at 12:52pm — No Comments
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Added by TINC on June 28, 2011 at 7:17pm — No Comments
Survey, Screening, Dynamics:
High-Speed AFM Imaging with
Bruker's Dimension FastScanTM AFM
Added by TINC on June 15, 2011 at 6:50pm — No Comments
Atomic Force Microscopy Seminars on Line!
Agilent Technologies invites you to attend our scientific e-Seminars. These exclusive one-hour live events provide a great opportunity to learn about some of the latest…
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Welcome! Nanopaprika was cooked up by Hungarian chemistry PhD student in 2007. The main idea was to create something more personal than the other nano networks already on the Internet. Community is open to everyone from post-doctorial researchers and professors to students everywhere.
There is only one important assumption: you have to be interested in nano!
Dr. András Paszternák, founder of Nanopaprika
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© 2013 Created by Dr. András Paszternák, founder.