All Blog Posts Tagged 'AFM' (73)


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Highly Oriented Pyrolytic Graphite (HOPG) to buy

HOPG

TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It’s a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and scanning tunnelling microscopy.



HOPG crystals are widely used as substrates in STM (Scanning Tunneling Microscopy). The most distinguishing…

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Added by TipsNano on July 2, 2017 at 9:53am — No Comments


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TipsNano Co is an International Company

TipsNano Co is an International Company created on the basis of the fundamental experience in SPM field. All our team has worked in AFM research sphere  during 20 years and accepted high level of professionalism.  

Starting to supply with accessories for scanning probe microscopy, TipsNano is getting a high-tech company and widened our  manufacture and sales boundaries in the…

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Added by TipsNano on July 2, 2017 at 9:43am — No Comments


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Fabrication of advanced probes for atomic force microscopy using focused ion beam

The method of Atomic Force Microscopy (AFM) holds the greatest

promise for surface diagnostics and analysis. The use of AFM allows

one to study the local geometric, electrical, and mechanical properties

of the substrate surface and form nanoscale structures on the surface

of solids [1]. The resolution of AFM is defined by many factors, most of

which are related to the shape and quality of the preparation of probes.

In…

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Added by TipsNano on June 30, 2017 at 4:44am — No Comments


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All Types of AFM Probes‎ - AFM Probes, AFM Cantilever, AFM Tips, AFM Cantilevers, AFM Cantilever Types, AFM, Probes

Join thousands of users that have purchased TipsNano AFM Probes for their projects. We offer the best and most reliable probes that are modestly priced and well proven in hundreds of scientific and top tier publications over the last 15 years. The Probe and Surface Laboratory at TipsNano boasts a large catalog of Modified and/or Functionalized AFM probes to meet your application needs.

  • AFM Bead, Sphere and Colloids mounted on AFM Cantilevers for force…
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Added by TipsNano on June 13, 2017 at 12:33pm — No Comments


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Inexpensive probes with precision and durability at the best value on the market

Start saving with TipsNano’s newest line of high-quality, low cost probes. Whether you’re an academic research institution looking for the most affordable probe available, or a high-volume industrial facility looking for dependability at a great price, our inexpensive probes provide precision and durability at the best value on the market

The company TipsNano represents all types…

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Added by TipsNano on June 13, 2017 at 12:00pm — No Comments


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Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI: 10.1016/j.apsusc.2016.03.201)

Abstract: A method of distributed calibration of a probe microscope scanner is suggested. The main idea…

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Added by Rostislav V. Lapshin on May 18, 2016 at 9:51pm — No Comments


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Nanopuller - a program to control DIY force spectroscopy AFM

We encourage to test our software that can greatly help in building your home made force spectroscopy Atomic Force Microscope experiment. Or it can be used to upgrade old AFM with cantilever calibration ability.



The program can be found here



https://sourceforge.net/projects/nanopuller/





It is described in Ultramicroscopy paper …



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Added by Janusz Strzelecki on March 21, 2016 at 1:11pm — No Comments


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Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI: 10.1016/j.apsusc.2015.10.108)

Abstract: The method of distributed calibration of a probe microscope scanner consists in a…

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Added by Rostislav V. Lapshin on November 28, 2015 at 4:30pm — No Comments


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Nondestructive Characterization of Advanced Polymeric Materials - Bruker Webinar

Atomic Force Microscopy (AFM) is a powerful technique for mapping topography with resolution down to the atomic level. PeakForce Tapping expands upon traditional AFM by making it radically easier to use while retaining high quality topographic imaging. With PeakForce QNM, PeakForce TUNA and PeakForce KPFM, PeakForce Tapping also enables quantitative nanoscale maps of mechanical and electrical sample properties, at similar resolution to the topographic maps. These capabilities…

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Added by TINC on March 11, 2015 at 4:39pm — No Comments


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In-situ electrochemistry with AFM & STM - The First European-wide Keysight EC-AFM/STM meeting

You are cordially invited to participate in Keysight Technologies' first European-wide in-situ EC with AFM & STM meeting! This unique two-day gathering will be hosted by The University of Liverpool in the UK. We are delighted to announce as invited keynote speakers:…

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Added by TINC on January 9, 2015 at 10:00pm — No Comments


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Postdoctoral Research Associate Search – Scanning Probe Microscopy

A postdoctoral research associate position in the area of scanning probe microscopy and applications is available, subject to the availability of funds, in the Chemistry Department at Wright State University starting on or after July 1, 2014.  The position will be for one year.  A Ph.D. in Mechanical Engineering, Physics, Chemistry or a closely related discipline is required prior to the date of hire.  ABDs and recent graduates are encouraged to apply.  Experience in design or construction…

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Added by Steven R. Higgins on May 22, 2014 at 6:43pm — No Comments


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Beyond the Diffraction Limit: AFM Integration with Light - webinar

In this webinar we will present exciting recent applications and instrumentation developments in the field of AFM integration with optics aimed for super-resolution optical imaging. The material presented will include:



Tip Enhanced Raman Scattering (TERS, “nano-Raman”)

• ~10 nm resolution hyper-spectral chemical and structural imaging of: DNA, graphene, semiconductors, polymers, molecular monolayers, lipid membranes, various protein structures etc.

• Reliable probes for…

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Added by Chief Editor- Nanopaprika on May 20, 2014 at 8:28pm — No Comments


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AFM Webinar: New Capabilities enabled by MultiMode and Dimension AFM Upgrades Explained

AFM Webinar Series

Accelerate Your AFM Research: New Capabilities enabled by…

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Added by Chief Editor- Nanopaprika on March 22, 2014 at 12:21pm — No Comments


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New Online AFM Seminars Present Advanced Techniques, Applications

Agilent Images
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Added by TINC on September 20, 2013 at 3:00pm — No Comments


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Surface Nanostructuration and developpement of nanothermal characterization of ultra thin nanostructured thermosets films - 1-year Postdoctoral Position

MAPIEM, is a laboratory dedicated to applied and fundamental research in interface composites ageing sciences at the University of Toulon within the marine scientific domain of the international Cluster Pôle Mer-PACA and the aeronautic and space domain of the cluster Pegase (http://mapiem.univ-tln.fr).

It is committed to the development of characterization at nanoscale (mechanic, thermal analysis) in order to determine properties of…

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Added by carriere on August 8, 2013 at 9:36am — No Comments

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