TipsNano supply with Highly Oriented Pyrolytic Graphite (HOPG). It’s a type of pure, highly laminar graphite used as an atomic-scale calibration standard for atomic force microscopy and scanning tunnelling microscopy.
HOPG crystals are widely used as substrates in STM (Scanning Tunneling Microscopy). The most distinguishing…
Added by TipsNano on July 2, 2017 at 9:53am — No Comments
TipsNano Co is an International Company created on the basis of the fundamental experience in SPM field. All our team has worked in AFM research sphere during 20 years and accepted high level of professionalism.
Starting to supply with accessories for scanning probe microscopy, TipsNano is getting a high-tech company and widened our manufacture and sales boundaries in the…Continue
Added by TipsNano on July 2, 2017 at 9:43am — No Comments
The method of Atomic Force Microscopy (AFM) holds the greatest
promise for surface diagnostics and analysis. The use of AFM allows
one to study the local geometric, electrical, and mechanical properties
of the substrate surface and form nanoscale structures on the surface
of solids . The resolution of AFM is defined by many factors, most of
which are related to the shape and quality of the preparation of probes.
Added by TipsNano on June 30, 2017 at 4:44am — No Comments
Join thousands of users that have purchased TipsNano AFM Probes for their projects. We offer the best and most reliable probes that are modestly priced and well proven in hundreds of scientific and top tier publications over the last 15 years. The Probe and Surface Laboratory at TipsNano boasts a large catalog of Modified and/or Functionalized AFM probes to meet your application needs.
Added by TipsNano on June 13, 2017 at 12:33pm — No Comments
Start saving with TipsNano’s newest line of high-quality, low cost probes. Whether you’re an academic research institution looking for the most affordable probe available, or a high-volume industrial facility looking for dependability at a great price, our inexpensive probes provide precision and durability at the best value on the market.
The company TipsNano represents all types…Continue
Added by TipsNano on June 13, 2017 at 12:00pm — No Comments
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI: 10.1016/j.apsusc.2016.03.201)
Abstract: A method of distributed calibration of a probe microscope scanner is suggested. The main idea…Continue
Added by Rostislav V. Lapshin on May 18, 2016 at 9:51pm — No Comments
We encourage to test our software that can greatly help in building your home made force spectroscopy Atomic Force Microscope experiment. Or it can be used to upgrade old AFM with cantilever calibration ability.
The program can be found here
It is described in Ultramicroscopy paper …
Added by Janusz Strzelecki on March 21, 2016 at 1:11pm — No Comments
R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI: 10.1016/j.apsusc.2015.10.108)
Abstract: The method of distributed calibration of a probe microscope scanner consists in a…Continue
Added by Rostislav V. Lapshin on November 28, 2015 at 4:30pm — No Comments
Atomic Force Microscopy (AFM) is a powerful technique for mapping topography with resolution down to the atomic level. PeakForce Tapping expands upon traditional AFM by making it radically easier to use while retaining high quality topographic imaging. With PeakForce QNM, PeakForce TUNA and PeakForce KPFM, PeakForce Tapping also enables quantitative nanoscale maps of mechanical and electrical sample properties, at similar resolution to the topographic maps. These capabilities…Continue
Added by TINC on March 11, 2015 at 4:39pm — No Comments
You are cordially invited to participate in Keysight Technologies' first European-wide in-situ EC with AFM & STM meeting! This unique two-day gathering will be hosted by The University of Liverpool in the UK. We are delighted to announce as invited keynote speakers:…Continue
Added by TINC on January 9, 2015 at 10:00pm — No Comments
Added by TINC on October 15, 2014 at 3:30pm — No Comments
Added by TINC on October 13, 2014 at 7:30pm — No Comments
Added by TINC on July 1, 2014 at 7:13pm — No Comments
A postdoctoral research associate position in the area of scanning probe microscopy and applications is available, subject to the availability of funds, in the Chemistry Department at Wright State University starting on or after July 1, 2014. The position will be for one year. A Ph.D. in Mechanical Engineering, Physics, Chemistry or a closely related discipline is required prior to the date of hire. ABDs and recent graduates are encouraged to apply. Experience in design or construction…Continue
Added by Steven R. Higgins on May 22, 2014 at 6:43pm — No Comments
In this webinar we will present exciting recent applications and instrumentation developments in the field of AFM integration with optics aimed for super-resolution optical imaging. The material presented will include:
Tip Enhanced Raman Scattering (TERS, “nano-Raman”)
• ~10 nm resolution hyper-spectral chemical and structural imaging of: DNA, graphene, semiconductors, polymers, molecular monolayers, lipid membranes, various protein structures etc.
• Reliable probes for…
Added by Chief Editor- Nanopaprika on May 20, 2014 at 8:28pm — No Comments
Added by TINC on April 1, 2014 at 10:00pm — No Comments
AFM Webinar Series
Accelerate Your AFM Research: New Capabilities enabled by…Continue
Added by Chief Editor- Nanopaprika on March 22, 2014 at 12:21pm — No Comments
Added by Chief Editor- Nanopaprika on March 17, 2014 at 7:00pm — No Comments
Added by TINC on September 20, 2013 at 3:00pm — No Comments
MAPIEM, is a laboratory dedicated to applied and fundamental research in interface composites ageing sciences at the University of Toulon within the marine scientific domain of the international Cluster Pôle Mer-PACA and the aeronautic and space domain of the cluster Pegase (http://mapiem.univ-tln.fr).
It is committed to the development of characterization at nanoscale (mechanic, thermal analysis) in order to determine properties of…Continue
Added by carriere on August 8, 2013 at 9:36am — No Comments