Full member
Rostislav V. Lapshin
  • 49, Male
  • Moscow
  • Russian Federation
Share on Facebook
Share
  • Blog Posts (3)
  • Discussions
  • Events
  • Groups
  • Photos
  • Photo Albums
  • Videos

Rostislav V. Lapshin's Friends

  • Nagendra Pratap Singh
  • Meghraj
  • TINC
  • András Paszternák, PhD (founder)
 

Rostislav V. Lapshin's Page

Latest Activity


Full member
Nagendra Pratap Singh liked Rostislav V. Lapshin's profile
May 19

Full member
TINC liked Rostislav V. Lapshin's blog post Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode
May 18

Full member
Rostislav V. Lapshin posted blog posts
May 18

Full member
Rostislav V. Lapshin posted blog posts
Jan 16

Full member
TINC liked Rostislav V. Lapshin's blog post Research Article: STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite
Dec 23, 2015

Full member
Rostislav V. Lapshin posted a blog post
Dec 23, 2015

Full member
TINC liked Rostislav V. Lapshin's blog post Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description
Nov 28, 2015

Full member
Rostislav V. Lapshin posted a blog post

Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI: 10.1016/j.apsusc.2015.10.108)Abstract: The method of distributed calibration of a probe microscope scanner consists in a search for a net of local…See More
Nov 28, 2015

Profile Information

I am...
Physicist, Engineer, Project coordinator, User of nanotechnology products
My research field or area of interest innanotechnology
scanning tunneling microscopy (STM), atomic-force microscopy (AFM), scanning probe microscopy (SPM), optical profilometry (OP), infrared microscopy (IRM), high capacity probe storage, nanometrology, automatic surface characterization, nanolithography, nanomanipulation, nanoassembling, bottom-up nanofabrication, molecular manufacturing, nanotechnology, catalytic nanoparticles, micromechanical bimaterial infrared detectors
Interest in...
I am searching for partner(s) interested in further development and/or commercialization of the feature-oriented scanning (FOS) methodology that is applicable for high-precision, high-resolution scanning probe microscopy, automatic surface characterization, nanometrology, and unmanned bottom-up nanofabrication both in single- and multiprobe configurations. Feel free to contact me if you have any questions, comments or research/business proposals related to such collaboration.
Publication list
R. V. Lapshin, “Productive drift-insensitive distributed calibration of probe microscope scanner in nanometer range”, 2016 (under preparation)

R. V. Lapshin, “Observation of a hexagonal superstructure on pyrolytic graphite by method of feature-oriented scanning tunneling microscopy”, 2016 (under preparation)

R. V. Lapshin, “Detection of low-contrast beating (moiré) on tunneling microscope scans by virtual distributed calibration method”, 2016 (under preparation)

R. V. Lapshin, “Improved analytical model for the approximation of hysteresis loops”, 2016 (submitted, supplementary materials: Mathcad worksheet “Hysteresis loop”)

R. V. Lapshin, “Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Real mode”, 2016 (prepared, preprint)

R. V. Lapshin, “Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode”, Applied Surface Science, volume 378, pages 530-539, 2016

R. V. Lapshin, “STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite”, Applied Surface Science, volume 360, part B, pages 451-460, 2016

R. V. Lapshin, “Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description”, Applied Surface Science, volume 359, pages 629-636, 2015

R. V. Lapshin, R. Z. Khafizov, E. A. Fetisov, “Mathematical treatment of the output optical image of a focal plane array of uncooled bimaterial detectors of infrared range by method of feature-oriented scanning”, Instruments and Experiment Technique, number 5, pages 52-58, 2015 (in Russian); R. V. Lapshin, R. Z.
Khafizov, E. A. Fetisov, “Computer processing of the output optical image of a focal plane array of uncooled bimaterial IR-detectors by method of feature-oriented scanning”, Instruments and Experimental Techniques, volume 58, number 5, pages 631-636, 2015

R. Lapshin, “Feature-oriented scanning probe microscopy: precision measurements, nanometrology, bottom-up nanotechnologies”, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, number 9, pages 94-106, 2014 (in Russian)

R. Lapshin, P. Azanov, “Nickel nanoparticles reduce temperature of synthesis of carbon nanostructures”, Electronics: Science, Technology, Business, Special issue “50 years of the Institute of Physical Problems”, number 9, pages 112-115, 2014 (in Russian)

D. B. Rygalin, E. A. Fetisov, R. Z. Khafizov, V. I. Zolotarev, I. A. Reshetnikov, G. A. Rudakov, R. V. Lapshin, E. P. Kirilenko, “Promising integral matrix detectors of thermal radiation with optical reading”, Russian Microelectronics, volume 43, number 7, pages 516-518, 2014

R. Z. Khafizov, E. A. Fetisov, R. V. Lapshin, E. P. Kirilenko, V. N. Anastasyevskaya, I. V. Kolpakov, “Thermomechanical sensitivity of uncooled bimaterial detector of IR-range fabricated by technology of microoptomechanical systems”, Advances in Applied Physics, volume 1, number 4, pages 520-523, 2013 (in Russian)

R. V. Lapshin, “Feature-oriented scanning probe microscopy”, Encyclopedia of Nanoscience and Nanotechnology, edited by H. S. Nalwa, volume 14, pages 105-115, American Scientific Publishers, 2011

A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, “Synthesis of biocompatible surfaces by nanotechnology methods”, Russian nanotechnologies, volume 5, numbers 9-10, pages 128-136, 2010 (in Russian); A. P. Alekhin, G. M. Boleiko, S. A. Gudkova, A. M. Markeev, A. A. Sigarev, V. F. Toknova, A. G. Kirilenko, R. V. Lapshin, E. N. Kozlov, D. V. Tetyukhin, “Synthesis of biocompatible surfaces by nanotechnology methods”, Nanotechnologies in Russia, volume 5, numbers 9-10, pages 696-708, 2010

R. V. Lapshin, A. P. Alekhin, A. G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 1, pages 5-16, 2010 (in Russian); R. V. Lapshin, A. P. Alekhin, A.
G. Kirilenko, S. L. Odintsov, V. A. Krotkov, “Vacuum ultraviolet smoothing of nanometer-scale asperities of poly(methyl methacrylate) surface”, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 4, number 1, pages 1-11, 2010

R. V. Lapshin, “Availability of feature-oriented scanning probe microscopy for remote-controlled measurements on board a space laboratory or planet exploration rover”, Astrobiology, volume 9, number 5, pages 437-442, 2009

R. V. Lapshin, “Method for automatic correction of drift-distorted SPM-images”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 13-20, 2007 (in Russian); R. V. Lapshin, “A method for automatic correction of drift-distorted SPM images”, Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, volume 1, number 6, pages 630-636, 2007

R. V. Lapshin, “Automatic drift elimination in probe microscope images based on techniques of counter-scanning and topography feature recognition”, Measurement Science and Technology, volume 18, issue 3, pages 907-927, 2007 (Russian translation is available)

A. P. Alekhin, A. G. Kirilenko, A. I. Kozlitin, R. V. Lapshin, S. N. Mazurenko, “Hydrophobic-hydrophilic nanostructure synthesis on polymer surfaces in low-temperature carbon plasma”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 8-11, 2006 (in Russian)

R. V. Lapshin, “Automatic distributed calibration of probe microscope scanner”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 11, pages 69-73, 2006 (in Russian)

R. V. Lapshin, “Feature-oriented scanning methodology for probe microscopy and nanotechnology”, Nanotechnology, volume 15, issue 9, pages 1135-1151, 2004 (Russian translation is available)

A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, “Surface morphology of thin carbon films deposited from plasma on polyethylene with low density”, Journal of Surface. Roentgen, Synchrotron and Neutron Studies, number 2, pages 3-9, 2004 (in Russian)

A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, “Investigation of nanostructured carbon coating on polyethylene as a substrate”, Journal of Applied Chemistry, volume 76, number 9, pages 1536-1540, 2003 (in Russian); A. P. Alekhin, A. G. Kirilenko, R. V. Lapshin, R. I. Romanov, A. A. Sigarev, “Nanostructured carbon coatings on polyethylene films”, Russian Journal of Applied Chemistry, volume 76, number 9, pages 1497-1501, 2003

R. V. Lapshin, “Digital data readback for a probe storage device”, Review of Scientific Instruments, volume 71, number 12, pages 4607-4610, 2000

R. V. Lapshin, “Automatic lateral calibration of tunneling microscope scanners”, Review of Scientific Instruments, volume 69, number 9, pages 3268-3276, 1998

R. V. Lapshin, “Analytical model for the approximation of hysteresis loop and its application to the scanning tunneling microscope”, Review of Scientific Instruments, volume 66, number 9, pages 4718-4730, 1995 (Russian translation is available, supplementary materials: Mathcad worksheet “Hysteresis loop”)

R. V. Lapshin, “Hysteresis compensation model for STM scanning unit”, Proceedings of the Second International Conference on Nanometer-Scale Science and Technology (NANO-II), Herald of Russian Academy of Technological Sciences, volume 1, number 7, part B, pages 511-529, Moscow, Russia, 1994 (supplementary materials: Mathcad worksheet “Hysteresis loop”)

R. V. Lapshin, O. V. Obyedkov, “Fast-acting piezoactuator and digital feedback loop for scanning tunneling microscopes”, Review of Scientific Instruments, volume 64, number 10, pages 2883-2887, 1993
Researchgroup, Institute, University, School, Company name
Solid Nanotechnology Laboratory, Nanoelectronics Department, Institute of Physical Problems named after F. V. Lukin
Researchgroup, Institute, Company, University, School webpage
http://www.lapshin.fast-page.org/
The network creator will send periodical messages to members - you below to allow us to email you
yes

Rostislav V. Lapshin's Blog

Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode

Posted on May 18, 2016 at 9:51pm 0 Comments

R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Virtual mode, Applied Surface Science, vol. 378, pp. 530-539, 2016 (DOI: 10.1016/j.apsusc.2016.03.201)

Abstract: A method of distributed calibration of a probe microscope scanner is suggested. The main idea…

Continue

Research Article: STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite

Posted on December 23, 2015 at 7:00pm 0 Comments

R. V. Lapshin, STM observation of a box-shaped graphene nanostructure appeared after mechanical cleavage of pyrolytic graphite, Applied Surface Science, vol. 360, part B, pp. 451-460, 2016 (DOI: 10.1016/j.apsusc.2015.09.222)

Abstract: A description is given of a three-dimensional box-shaped graphene (BSG)…

Continue

Research Article: Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description

Posted on November 28, 2015 at 4:30pm 0 Comments

R. V. Lapshin, Drift-insensitive distributed calibration of probe microscope scanner in nanometer range: Approach description, Applied Surface Science, vol. 359, pp. 629-636, 2015 (DOI: 10.1016/j.apsusc.2015.10.108)

Abstract: The method of distributed calibration of a probe microscope scanner consists in a search…

Continue

Comment Wall (2 comments)

You need to be a member of The International NanoScience Community to add comments!

Join The International NanoScience Community

At 2:44pm on May 25, 2008,
Full member
VEDPRIYA ARYA
said…
Hello sir
myself vedpriya arya doink work on Biological synthesis of nanoparticles in microbes and plants
At 6:29pm on May 15, 2008,
Certified Member
András Paszternák, PhD (founder)
said…
welcome to the nanoscience network

andras paszternak, editor
 
 
 

Welcome - about us

Welcome! Nanopaprika was cooked up by Hungarian chemistry PhD student in 2007. The main idea was to create something more personal than the other nano networks already on the Internet. Community is open to everyone from post-doctorial researchers and professors to students everywhere.

There is only one important assumption: you have to be interested in nano!

Nanopaprika is always looking for new partners, if you have any idea, contact me at editor@nanopaprika.eu

Dr. András Paszternák, founder of Nanopaprika

Next partner events of TINC

We are Media Partner of:

© 2016   Created by András Paszternák, PhD (founder).   Powered by

Badges  |  Report an Issue  |  Terms of Service