Scanning Probe Microscope MultiMode AFM V with Active vibration isolation table
Modes:
■CM - contact mode (including in fluids operation);
■LFM - lateral force microscopy;
■TM - tapping mode AFM;
■HSTM - high speed tapping mode AFM;
■PI - phase imaging;
■TR - torsion resonance mode;
■MFM - magnetic force imaging;
■FM - force modulation;
■C-AFM - conductive AFM;
■STM - scanning tuneling microscopy;
■EFM - electric force microscopy;
■Nanoindentation - nanoindentation, scratching and wear testing.
Technical specification of the AFM:
■Max resolution: 5120 lines;
■Effectiveness scan size: 0,1 to 160 µm;
■Smallest visible size (1px): < 0,02 nm;
■Size of the sample: diameter < 15 mm, height < 7 mm;
■CCD camera magnification: ca. 450x;
■Heating device: Troom - 250o C.
Additional equipment:
■Antistatic cap;
■The Atmospheric Hood;
■Cylinder Cap;
■Passive antishaking tabble with soundproof cap;
■Table Stable TS-150;
■Scanners: 10 µm, 100 µm, 160 µm.
Technical specification of Table Stable TS-50:
■Load range: 0 do 150 kg;
■Frequency: 0,7 - 1000 Hz;
■Dimensions: 400x450x75mm.
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