Relfectoscope USN-60

Parameters: - measuring range 1mm - 28m - gain 0-110 dB - monitor – two independent gates - evaluation height of echo in dB and % - system determination height of echo defect - DAC i TCG - memory- 250 collection of result or 250 pictures Sensors: model of sensors (sample rate) - K1K(1MHz), MB2F(2MHz), MB4F(4MHz), MB4Y(4MHz), K15K(15MHz), ND23(23MHz), MWB45-2E(2MHz), MWB60-2E(2MHz), MWB70-2E(2MHz), MWB90-2E(2MHz), MWB90-2E(4MHz) Method description: Relfectoscope USN-60 produced by Krautkramer can evaluate state microstructure and macrostructure of material. Besides detect discontinuity material in form cracks whether emptiness. Using relfectoscope you’re able to describe them type of dimension and depth fall into arrears defect of material. By means of system can define thickness of walls research elements whether layers and quality dimensions typical of material such as: velocity and attenuation wave ultrasonic. Applications: - evaluation state microstructure and macrostructure of materials (find, recognize and describe defects of material) - measurement dimensions geometric (thickness of walls or layers) - measurement dimensions characteristic for material (velocity and attenuation wave ultrasonic). Additional information: System has got sensors bean-reception heads emitting transverse and longitudinal waves in normal direction. Defectoscope contain also Ultradoc program to communicate with computer. It’s possible to copy saved screens of scopes as a graphic files, data sets such as suppressions value, ultrasonic wave velocity and thickness of elements. This program has one limitation-impossible to save data compatible to Excel. Dr. Wojciech Spychalski and Mr. Krzysztof Batorski handled this problem. They wrote a program that makes possible copying data from defectoscope to computer. It allows further signal filtering and analysis using mathematical programs.

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