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Nanocarrier Accumulation in Ovaries: A Neglected Topic In Nanotoxicology and Nanopathology?…
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TINC liked LaVerne L Poussaint's blog post Nanocarrier Accumulation in Ovaries: A Neglected Topic In Nanotoxicology and Nanopathology?
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Welcome! Nanopaprika was cooked up by Hungarian chemistry PhD student in 2007. The main idea was to create something more personal than the other nano networks already on the Internet. Community is open to everyone from post-doctorial researchers and professors to students everywhere.
There is only one important assumption: you have to be interested in nano!
Dr. András Paszternák, founder of Nanopaprika
The invertion of 10G optical transceiver has greatly increase the networking speed, for the science behind the transceiver, please check website and learn about CWDM SFP transceiver, www.fiberoptictransceiver.net
For information of DWDM sfp, please go to http://www.fiberoptictransceiver.net/dwdm-sfp/
The XFP (10 Gigabit Small Form Factor Pluggable) is a standard for transceivers for high-speed computer network and telecommunication links that use optical fiber.please visit www.xfptransceiver.com for more info
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Microlab 350 from Thermo Electron is a high resolution, Auger system. Optionally, it is capable of multi-technique analysis and may be fitted with a range of preparation facilities.
Its key features are:
■Spatial resolution (7 nm SEM-Scanning Electron Microscopy, 12nm SAM-Scanning Auger Microscopy)
■High sensitivity tunable (RR 2.8 – 40)
■User selectable energy resolution 0.6% - 0.06%
■Multi-technique capability (AES-Auger Electron Spectroscopy, XPS-X-ray Photoelectron Spectroscopy).
Microlab 350 is a high-performance scanning Auger instrument using field emission technology to provide high spatial resolution. The spherical sector analyzer (SSA), used on Microlab 350, allows the analysts to select the best combination of energy resolution and sensitivity for each analysis, in common with most other spectroscopic techniques. Microlab 350 additionally is equipment with:
■X-ray gun (twin anode source: AlKα, MgKα) for XPS measurements (spatial distribution: average value from all sample surface area);
■ion gun for sputter etching, usually ion gun is used for depth profiling, sample cleaning and charge compensation.
This instrument is particularly useful to investigate small surface features, thin layers, impurities in materials as well as to determine their chemical (elemental) composition and chemical state of their components.
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