Photos 2.0

High Resolution Transmission Electron Microscope (HRTEM) JEOL JEM 3010

Posted by Materials Design Division on June 2, 2010 at 3:31pm

(300 kV, resolution 0.19 nm), equipped with EDS (ISIS by Oxford Instruments Ltd.) for chemical analysis in nano-volumes and a possibility of CBED (Converged Beam Electron Diffraction), and advanced image analysis systems equipped with specialized software for micro- and nano-structure analysis

main equipment

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