2012 European Conference on Electrical Measurements at the Nanoscale Using AFM

Agilent Technologies cordially invites you to attend a scientific conference focusing on electrical measurements using atomic force microscopy (AFM). This special event will be held on 4 July, 2012, at the Institute of Biophysics, Johannes Kepler University in Linz, Austria. You are also welcome to attend additional sessions/demonstrations on 3 July or 5 July. Details will follow.   

The conference offers an excellent opportunity to present your current research in fields relating to nanoscale materials and electrical characterization, including KFM, EFM & SMM. Share and discuss your experiences, applications, and ideas with fellow researchers and Agilent staff scientists in a relaxed and friendly atmosphere. Work will be presented by leading experts from across Europe.